JPH01154697U - - Google Patents
Info
- Publication number
- JPH01154697U JPH01154697U JP5204988U JP5204988U JPH01154697U JP H01154697 U JPH01154697 U JP H01154697U JP 5204988 U JP5204988 U JP 5204988U JP 5204988 U JP5204988 U JP 5204988U JP H01154697 U JPH01154697 U JP H01154697U
- Authority
- JP
- Japan
- Prior art keywords
- shield box
- under test
- device under
- metal
- wireless
- Prior art date
- Legal status (The legal status is an assumption and is not a legal conclusion. Google has not performed a legal analysis and makes no representation as to the accuracy of the status listed.)
- Pending
Links
- 239000006096 absorbing agent Substances 0.000 claims description 4
- 239000002184 metal Substances 0.000 claims 5
- 239000002131 composite material Substances 0.000 claims 2
- 229910052755 nonmetal Inorganic materials 0.000 claims 2
- 230000035945 sensitivity Effects 0.000 claims 2
- 244000144985 peep Species 0.000 description 1
Landscapes
- Testing Electric Properties And Detecting Electric Faults (AREA)
- Shielding Devices Or Components To Electric Or Magnetic Fields (AREA)
Priority Applications (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5204988U JPH01154697U (en]) | 1988-04-18 | 1988-04-18 |
Applications Claiming Priority (1)
| Application Number | Priority Date | Filing Date | Title |
|---|---|---|---|
| JP5204988U JPH01154697U (en]) | 1988-04-18 | 1988-04-18 |
Publications (1)
| Publication Number | Publication Date |
|---|---|
| JPH01154697U true JPH01154697U (en]) | 1989-10-24 |
Family
ID=31278059
Family Applications (1)
| Application Number | Title | Priority Date | Filing Date |
|---|---|---|---|
| JP5204988U Pending JPH01154697U (en]) | 1988-04-18 | 1988-04-18 |
Country Status (1)
| Country | Link |
|---|---|
| JP (1) | JPH01154697U (en]) |
Cited By (2)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0712874A (ja) * | 1993-06-22 | 1995-01-17 | Nec Corp | 受信機温度検査装置 |
| WO2007097087A1 (ja) * | 2006-02-27 | 2007-08-30 | Nippon Light Metal Company, Ltd. | 電子機器用試験装置および電子機器試験方法 |
Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62122199A (ja) * | 1985-11-21 | 1987-06-03 | 清水建設株式会社 | 電波暗室の構造 |
-
1988
- 1988-04-18 JP JP5204988U patent/JPH01154697U/ja active Pending
Patent Citations (1)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPS62122199A (ja) * | 1985-11-21 | 1987-06-03 | 清水建設株式会社 | 電波暗室の構造 |
Cited By (3)
| Publication number | Priority date | Publication date | Assignee | Title |
|---|---|---|---|---|
| JPH0712874A (ja) * | 1993-06-22 | 1995-01-17 | Nec Corp | 受信機温度検査装置 |
| WO2007097087A1 (ja) * | 2006-02-27 | 2007-08-30 | Nippon Light Metal Company, Ltd. | 電子機器用試験装置および電子機器試験方法 |
| JP2007225567A (ja) * | 2006-02-27 | 2007-09-06 | Nippon Light Metal Co Ltd | 電子機器用試験装置および電子機器試験方法 |